![]() Mt. Fuji |
SIP-IMASM2017 ![]() ![]() |
![]() Mt. Tsukuba and the science city |
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Oral session (Program, Abstract booklet)
Poster session
CFRP & Polymer | ||
1-1 | Akira Uedono (U. Tsukuba) | Behaviors of Free Volumes During Curing Processes of Epoxy Resins for CFRP studied by Positron Annihilation |
1-2 | Manabu Tezura (U. Tsukuba) | High-Resolution Transmission Electron Microscopy of Interfaces in Carbon Fiber Reinforced Plastics |
1-3 | Hong Jun Zhang (U. Tsukuba) | Free-Volume Hole Properties of Epoxy Resins for CFRP studied by Positron Annihilation and PVT Experiments |
1-4 | Nao Terasaki (AIST) | Mechanoluminescent Visualization: From portent through process of destruction on CFRP structural material |
1-5 | Kazuya Kikunaga (AIST) | Evaluation of Electrical Conductivity of CFRP by Electrostatic Charge Distribution |
1-6 | Masahiro Ukibe (AIST) | Chemical and Electronic State X-ray Emission Analysis using SEM equipped with Superconducting Energy Dispersive Spectroscopy for Carbon Fibers and Resins in CFRP |
1-7 | Qinghua Wang (AIST) | Determination of Microscale Deformation Distributions of CFRP under Threepoint Bending from Sampling Moire Fringes |
1-8 | Harumichi Tanigawa (AIST) | Fatigue Damage Evaluation of Epoxy Resin using Positron Annihilation |
1-9 | Toshiki Watanabe (KEK) | In situ Observation of Crack Initiation and Propagation in CFRP using a Newly-Developed XAFS-CT |
1-10 | Yumiko Takahashi (KEK) | Non-Destructive Characterization of CFRP using Synchrotron X-ray CT |
1-11 | Tomohiro Ishii (KEK) | In Situ Observation of Crack Initiation and Propagation in CFRP using X-CT |
1-12 | Masahiro Kusano (NIMS) | Non-Destructive Evaluation of Defects in FRP by Mid-IR Laser Ultrasonic Testing |
1-13 | Kimiyoshi Naito (NIMS) | Interfacial Shear Strength Measurement for Interface-Controlled Carbon Fibers |
1-14 | Hisashi Yamawaki (NIMS) | Detection of Delamination in CFRP plate using ultrasonic visualization technique |
1-15 | Kanae Oguchi (U. Tokyo) | Numerical Simulation of Mid-IR Laser Ultrasound Testing for CFRP |
Metals | ||
2-1 | Takashi Nagoshi (AIST) | Sample Size Effect on Electrodeposited Sub-10 nm Nanocrystalline Nickel and possible application to CFRP |
2-2 | Wenfeng Mao (AIST) | Characterization of Defects in Mechanically Fatigued Stainless Steel by Positron Annihilation Spectroscopy |
2-3 | Tomoya Senda (AIST) | Positron Lifetime and EBSD Studies of Mechanically Fatigued Titanium Alloy |
2-4 | Paul Fons (AIST) | XAFS Measurements of VN Nano-precipitates in 9%Cr High-temperature Steel Alloys |
2-5 | Taisuke Sasaki (NIMS) | Microstructure Characterization of Structural Materials by Laser Assisted 3D Atom Probe |
2-6 | Norimichi Watanabe (NIMS) | Characterization of Boron Distribution in Heat-resistant Steels by TOF-SIMS |
2-7 | Norimichi Watanabe (NIMS) | Interface Melting in the Si/Al Interface Observed by TOF-SIMS |
2-8 | Hongxin Wang (NIMS) | Informatics-aided Confocal Raman Microscopy for 3D Characterization of Stress in Silicon |
2-9 | Hiroaki Mamiya (NIMS) | Study of the Nanoparticles Influence on the Mechanical Properties of Ni-fee N-containing ODS Alloy by Alloy Contrast Variation Analysis |
Ceramics & Coating | ||
3-1 | Hiroaki Mamiya (NIMS) | Multiscale Characterization of Advanced Ceramics and Alloys in Aerospace Applications |
3-2 | Shogo Kikuchi (U. Tsukuba) | The Development of In Situ High Temperature Transmission Electron Microscopy for Heat-Resistant Ceramics |
3-3 | Yasuo Takeichi (KEK) | Chemical State Mapping of Environmental Barrier Coating using a Newly-Developed XAFS-CT |
3-4 | Kenichi Kimijima (KEK) | In situ XAFS/XRD Simultaneous Measurement of Barrier Coating up to 1500C |
Measurement | ||
4-1 | Akiyoshi Yamazaki (U. Tsukuba) | Imaging of Hydrogen in Thin Samples with Microbeam Transmission ERDA Method |
4-2 | Akiyoshi Yamazaki (U. Tsukuba) | Two-Dimensional Mapping for Additive Light Elements in Structural Materials using Microbeam PIXE Method |
4-3 | Hideki Kobayashi (U. Tsukuba) | Development of In Situ High-Temperature Transmission Electron Microscopy using Micrometer Regional Pinpoint Heating |
4-4 | Shien Ri (AIST) | Full-Field Displacement and Strain Measurement by Moire Technique and its Practical Application |
4-5 | Keiichi Hirano (KEK) | X-ray Analyzer-based Phase-Contrastcomputed Laminography II |
Contact
SIP-IMASM2017 committee
AIST nanometronics lab/Nanoelectronics Research Institutes
National Institute of Advanced Industrial Science and Technology (AIST)
1-1-1, Umezono, Tsukuba, Ibaraki, 305-8568, Japan
E-mail: imasm-sympo@aist.go.jp
Last Updated: 8th June 2017